C-MET

C-MET: Equipment
Atomic Absorption Spectrometer
CHNS - O Analyser
Fourier Transform Infrared  Spectrometer
Gas Chromatography
Glow Discharge Optical Spectrometer (GD-OES)
High Performance Liquid Chromatography
Inductively Coupled Optical Emmission Spectrometer
Ion Chromatography
LF Impedance Analyser
Oxygen - Nitrogen Analyser
Hot Stage Polarising Microscop
Mercury Porasimeter
Potentiostat / Galavanostat
Particle Size Analyser
Scanning Electron Microscope
Thermogravimetric Analysis / SDTA
Thermal Analysis
DMA / TMA
Universal Testing Machine
X-Ray Diffractometer
X-Ray Fluorescene Spectrometer
 
 

Glow Discharge Optical Emission Spectrometer (GD-OES) : (JY-10000,France)



Principle

Glow discharge, well known as an extremely stable excitation source, creates a very uniform sputter spot on the analysed sample. This unique characteristic makes glow discharge an ideal source for quantitative depth profile analyses as well as highly accurate bulk content analysis.

The narrow emission lines created by glow discharge reduce line interference and result in simple linear calibrations. This ensures high precision and fewer calibration standards. When the excited atoms produced in the glow discharge return to ground state, they emit light. Each light wavelength emitted is characteristic of the atom from which it came. The light is focused onto the entrance slit of the spectrometer and separated by the concave holographic grating according to wavelength.

Applications:

Fast analysis ( <30> seconds)

Good sensitivity (typically down to 1ppm)

Good repeatabilit7y (1-3% RSD)

Fast stabilisation process.

Observation of film and interface contaminants

All metals, alloys, conductive and nonconductive materials like ceramics and glasses.

All elements from hydrogen to uranium.

Simple preparation of sample for bulk analysis.

Minimized matrix effects.

Linear calibrations over high dynamic range 1010.

Determination of major, minor, trace and ultra-trace elements.

Direct surface and depth profile analysis capability by time resolved measurement.

Sample Details

Solids





 
Centre for Materials for Electronics Technology